PURPOSE:To make it possible to manufacture an electrode having wide area and high efficiency by forming the thin film of an organic metal compound on the surface of an electrolyte film or a current collector from the solution containing a specific metal organic salt or metal alkoxide, then baking. CONSTITUTION:Metal organic salt or metal alkoxide containing metal ion which forms conductive perovskite type composite oxide is mixed. A mixed solution diluted with organic solvent if necessary, or the solution prepared by adding a metal or an inorganic compound which increases the activity and selectivity of a catalyst in the mixed solution is dropped on or applied to an electrolyte film or a current collector, or the electrolyte film or the current collector is immersed in the solution, then the solution is dried to form the metal organic compound on the surface of the electrolyte film or the current collector, and they are baked. Thereby, the perovskite type composite oxide is formed on the complicated surface or the micropores, and the efficiency of the electrode is increased.

1318735 Measuring Tension INDUR ANTRIEBSTECHNIK AG 9 Sept 1970 [ 9 Sept 1969] 43187/70 Headings G1N and G1W In an instrument for measuring the tension in a flexible web or thread 4, a measuring pulley 1 connected to a transducer 5 may be locked in at least two different positions relative to the two outer pulleys 2, 3, to vary the measuring range. The measuring pulley 1 may also be moved to a further position which allows the web or thread to move freely through the instrument. The transducer may be a differential transformer, a capacitative, photo-electric or semi-conductor transducer or a hydraulic load cell. The pulley 1 may be movable by the lever system shown in the figures or by a cam, or alteratively pulley 1 may be fixed and pulleys 2,3 movable. There may be three overlapping measuring ranges.

The present invention provides a laminated structure for measuring reflected light intensity able to measure the thickness of a surface adsorbed film with high sensitivity by a simple optical technique. Provided are a laminated structure for measuring reflected light intensity at at least one wavelength that comprises a valve metal optical interference layer, and a method for measuring film thickness and/or mass and/or viscosity of a thin film targeted for measurement by radiating light onto the thin film targeted for measurement and measuring a change in reflected light intensity at at least one wavelength in a measurement medium in this laminated structure for measuring reflected light intensity.

The present invention provides a real-time luminescent piezoelectric detector capable of sensing the presence of biological and chemical agents. This detector includes a free-standing thin film that is driven by a frequency driver to produce light emitted from an edge of the thin film. A surface layer sensitive to the biological or chemical agent to be detected is disposed on the surface of the thin film. In the presence of the biological or chemical agent to be detected, the light emitted from the edge of the thin film structure is altered. A processor capable of determining the presence and/or concentration of the biological or chemical agent in question based on the altered emitted light receives an output representative of the emitted light and outputs the status of the presence and/or concentration of the biological or chemical agent in question.

Disclosed is a system for measuring the contour of a curved surface of a transparent or semi-transparent material. The system comprises: an illumination device for emitting an illuminating light beam in a wide spectrum band; a dispersive objective lens, which is located in an emergent light direction of the illuminating light beam and is used for dispersing and decomposing the transmitted illuminating light beam into a set of monochromatic light beams with a convergence point corresponding to a wavelength; a test material support member for fixing a transparent or semi-transparent curved surface test material; a spectral analysis device for receiving upper surface reflected light and lower surface reflected light, and measuring a spectral chromatic aberration between the upper surface reflected light and the lower surface reflected light; and a processor for receiving the spectral chromatic aberration, obtaining the thickness of a scanned position according to the spectral chromatic aberration, and determining the contour of the transparent or semi-transparent curved surface test material according to the thickness of two or more scanned positions. The system can accurately detect a contour without being affected by the light transmittance of a test material. La présente invention concerne un système de mesure du contour d'une surface incurvée d'un matériau transparent ou semi-transparent. Le système comprend : un dispositif d'éclairage servant à émettre un faisceau lumineux d'éclairage dans une large bande spectrale; une lentille d'objectif de dispersion, qui est située dans une direction de lumière émergente du faisceau lumineux d'éclairage et qui est utilisée pour disperser et décomposer le faisceau lumineux d'éclairage émis en un ensemble de faisceaux lumineux monochromatiques ayant un point de convergence correspondant à une longueur d'onde; un élément de support de matériau de test servant à fixer un matériau de test à surface incurvée transparent ou semi-transparent; un dispositif d'analyse spectrale servant à recevoir une lumière réfléchie de surface supérieure et une lumière réfléchie de surface inférieure, et à mesurer une aberration chromatique spectrale entre la lumière réfléchie de surface supérieure et la lumière réfléchie de surface inférieure; et un processeur servant à recevoir l'aberration chromatique spectrale, à obtenir l'épaisseur d'une position balayée en fonction de l'aberration chromatique spectrale, et à déterminer le contour du matériau de test à surface incurvée transparent ou semi-transparent en fonction de l'épaisseur de deux ou plus de deux positions balayées. Le système peut détecter avec précision un contour sans être affecté par le facteur de transmission lumineuse d'un matériau de test. 本发明公开了一种透明或半透明材料曲面轮廓检测系统，包括：照明装置，用于出射宽谱段的照明光束；位于所述照明光束的出光方向上的色散物镜，用于将透射的照明光束色散分解为汇聚点与波长对应的单色光束的集合；检材支撑件，用于固定透明或半透明曲面检材；光谱分析装置，用于接收所述上表面反射光和下表面反射光，检测所述上表面反射光和下表面反射光的光谱色差；处理器，用于接收所述光谱色差，根据所述光谱色差得到所述扫描位置的厚度，根据两个或两个以上的扫描位置的厚度确定所述透明或半透明曲面检材的轮廓。上述系统能够不受检材透光性的影响，准确检测轮廓。

Observable changes in electrical and optical characteristics of individual molecules adsorbed on a conductor or semi-conductor caused by electrical and/or optical excitation or de-excitation of electrons within such molecules can be used as signals which in turn can be used to carry information and such observable information carrying changes or signals can be switched, amplified, and modulated by varying optical as well as electrical inputs to such molecules. Molecular structural design alters functional behavior of the molecular/quantum devices. In an example, monomeric metallated phthalocyanine behaves as a fast ( < 10-12second), energy efficient ( 3OkT/bit of information), fully reversible quantum switch with multiple outputs. However, if monomeric phthalocyanines are organized in structural combinations such as one dimensional wire-like ring-stacked, or two dimensional sheet-like ring-fused phthalocyanines, their electro-optical properties are significantly altered. As a consequence, their functionality behaves with properties that can replace a multiplicity of CMOS and similar classic semiconductor devices. Des modifications observables dans les caractéristiques électriques et optiques de molécules individuelles adsorbées sur un conducteur ou un semiconducteur dues à une excitation électronique de ces molécules (ou à l'arrêt d'une excitation) peuvent être utilisées comme signaux, lesquels peuvent à leur tour être utilisés pour porter des informations et ces modifications observables ou signaux porteurs d'informations peuvent être commutés, amplifiés et modulés par des variations d'entrées optiques et électriques dans ces molécules. La conception structurelle moléculaire modifie le comportement fonctionnel de ces dispositifs moléculaires/quantiques. Dans un exemple, une phtalocyanine métallisée monomère se comporte comme un commutateur quantique rapide ( < 10-12secondes) complètement inversible à efficience énergétique ( 3OkT/bit d'information), avec des entrée multiples. Cependant, si les phtalocyanines monomères sont organisés en combinaisons structurelles telles que des phtalocyanines à empilement de noyaux de type câble à une dimension ou telles que de phtalocyanines à fusion de noyaux de type feuille à deux dimensions, leurs propriétés électro-optiques sont considérablement modifiées. Par conséquent, leur fonctionnalité agit avec des propriétés qui peuvent remplacer une multiplicité de dispositifs semiconducteurs classiques CMOS et d'autres dispositifs similaires.

Devices and corresponding methods can be provided to monitor or measure temperature of a target or to control a process. Targets can have low, unknown, or variable emissivity. Devices and corresponding methods can be used to measure temperatures of thin film, partially transparent, or opaque targets, as well as targets not filling a sensor's field of view. Temperature measurements can be made independent of emissivity of a target surface by, for example, inserting a target between a thermopile sensor and a background surface maintained at substantially the same temperature as the thermopile sensor. In embodiment devices and methods, a sensor temperature can be controlled to match a target temperature by minimizing or zeroing a net heat flux at the sensor, as derived from a sensor output signal. Alternatively, a target temperature can be controlled to minimize the heat flux.

A double-sided optical inspection system is presented which may detect and classify particles, pits and scratches on thin film disks or wafers in a single scan of the surface. In one embodiment, the invention uses a pair of orthogonally oriented laser beams, one in the radial and one in the circumferential direction on both surfaces of the wafer or thin film disk. The scattered light from radial and circumferential beams is separated via their polarization or by the use of a dichroic mirror together with two different laser wavelengths.