【发明专利】 METHOD AND SYSTEM FOR DETECTING THICKNESS OF GRAPHENE OR MICRO-THIN FILM OF GRAPHITE
PROBLEM TO BE SOLVED: To provide a method for detecting a thickness of graphene or a micro-thin film of graphite with small space that is readily installed at low cost and allow any user, even a beginner, to readily determine the number of sheets of graphene atomic thin films in a reproducible fashion, and a system for detecting the thickness.
SOLUTION: A substrate as a reference sample having, provided thereon, a single layer of graphene or a micro-thin film of graphite formed by laminating two or more layers of graphene and a substrate as a measurement target sample are respectively imaged via a filter having a predetermined color. Appearance frequency characteristics with respect to a luminance value of the predetermined color are obtained in accordance with the imaged images. The appearance frequency characteristics are respectively normalized with the proviso that the luminance value of the predetermined color at the substrate part is made to be 100, and are displayed on a monitor so as to allow the characteristics to be compared with each other. In addition, the same or difference of features of change in the normalized frequency characteristics with respect to the luminance value of the predetermined color is determined so that presence or absence of each layer in the first to n-th (optional layer) layers in the measurement target sample is determined.
COPYRIGHT: (C)2010,JPO&INPIT
【发明专利】 Method for conducting chemical or biochemical reactions on a solid surface within an enclosed chamber
【发明专利】 SYSTEM AND METHOD FOR DOUBLE-SIDED OPTICAL INSPECTING THIN-FILM DISC OR WAFER
PROBLEM TO BE SOLVED: To provide a double-sided optical inspecting system for detecting and classifying particles, pits, or scratches on a thin-film disk or on a wafer, with a single scan on the surface.
SOLUTION: A pair of laser beams, projected so as to be orthogonal are used, such that one of the pair is used in the radial direction of the wafer or the thin-film disk, and the other is used in the circumferential direction. The lights, scattered from the radial direction and the circumferential direction are separated by using a dichroic mirror, together with a polarized light or different laser wavelength.
COPYRIGHT: (C)2005,JPO&NCIPI
【发明专利】 Miniature support for thin films containing single channels or nanopores and methods for using same
【发明专利】 Electron microscope for flaw analysis and inspecting electronic e.g. semiconductor or superconductor components
【发明专利】 METHOD AND APPARATUS FOR SEISMIC DATA ACQUISITION IN A LAND-OR TRANSITION ZONE ENVIRONMENT
【发明专利】 Temperature sensor for determining mass transfer rate and/or temperature rate of a flowing medium
【发明专利】 Improvements in or relating to devices utilising the hall effect and more particularly in magnetometers