基本信息
摘要：
PROBLEM TO BE SOLVED: To provide a method for detecting a thickness of graphene or a micro-thin film of graphite with small space that is readily installed at low cost and allow any user, even a beginner, to readily determine the number of sheets of graphene atomic thin films in a reproducible fashion, and a system for detecting the thickness.
SOLUTION: A substrate as a reference sample having, provided thereon, a single layer of graphene or a micro-thin film of graphite formed by laminating two or more layers of graphene and a substrate as a measurement target sample are respectively imaged via a filter having a predetermined color. Appearance frequency characteristics with respect to a luminance value of the predetermined color are obtained in accordance with the imaged images. The appearance frequency characteristics are respectively normalized with the proviso that the luminance value of the predetermined color at the substrate part is made to be 100, and are displayed on a monitor so as to allow the characteristics to be compared with each other. In addition, the same or difference of features of change in the normalized frequency characteristics with respect to the luminance value of the predetermined color is determined so that presence or absence of each layer in the first to n-th (optional layer) layers in the measurement target sample is determined.
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摘要附图：
