849,624. Testing physical qualities of materials. AVIATION, MINISTER OF, [formerly MINISTER OF SUPPLY]. May 14, 1957 [Feb. 16, 1956], No. 4844/56. Drawings to Specification. Class 106 (2). A method of testing the mechanical properties of materials comprises applying mechanically produced strains to the material under test through a deformable substrate to which the test material adheres throughout an area. The materials to be tested may include pastes, powders, polymer films and vacuum deposited films of metals. It is stated that the method may be applicable to a study of solid friction, of boundary lubrication, or of dilatant systems. Suitable substrates are formed from sheets of rubber, which may be arranged in the form of a cross, a disc, or an ellipse. Various methods are described by which tensional and shear forces may be applied to such members. It is also suggested that a partially inflated balloon might be used in certain circumstances. Other materials may also be used to form the substrate, such as a film of cellulose acetate, or a ductile metal, this being used for testing a thin film of brittle metal. For best results the test material should be sandwiched between two parallel substrates, in which case the mechanical actions imposed are more nearly homogeneous.

A double-sided optical inspection system is presented which may detect and classify particles, pits and scratches on thin film disks or wafers in a single scan of the surface. In one embodiment, the invention uses a pair of orthogonally oriented laser beams, one in the radial and one in the circumferential direction on both surfaces of the wafer or thin film disk. The scattered light from radial and circumferential beams is separated via their polarization or by the use of a dichroic mirror together with two different laser wavelengths.

Provided are a system and method for training or testing a state monitoring module. The system (10, 20, 30, 40) comprises: a vibration actuator (12, 22, 32, 42), wherein the vibration actuator comprises a vibration component (122, 222, 322, 4221, ..., 422n) and a controller (121, 221, 321, 421), and receives preset data, which represents a preset vibration, and controls, on the basis of the preset data, the vibration component to generate a vibration; and a sensor (13, 23, 33, 43), wherein the sensor senses the vibration of the vibration component and generates a signal which represents the vibration of the vibration component so as to train or test a state monitoring module. Therefore, a large amount of monitoring data can be provided simply, efficiently and reliably at a low cost so as to train or test a state monitoring module. L'invention concerne un système et un procédé de formation ou de test d'un module de surveillance d'état. Le système (10, 20, 30, 40) comprend : un actionneur de vibration (12, 22, 32, 42), l'actionneur de vibration comprenant un composant de vibration (122, 222, 322, 4221, ..., 422n) et un dispositif de commande (121, 221, 321, 421), et recevant des données préétablies représentant une vibration prédéfinie, et commandant, en fonction de données prédéfinies, au composant de vibration de générer une vibration ; et un capteur (13, 23, 33, 43), le capteur détectant la vibration du composant de vibration et générant un signal représentant la vibration du composant de vibration de manière à former ou à tester un module de surveillance d'état. Ainsi, une grande quantité de données de surveillance peut être fournie de manière simple, efficace et fiable à un faible coût de manière à former ou à tester un module de surveillance d'état. 提供了用于训练或测试状态监测模块的系统和方法。该系统（10,20,30,40）包括振动致动器（12,22,32,42），其包括振动部件（122,222,322,422 1,……422 n）和控制器（121,221,321,421,），其接收表示预设振动的预设数据，并且基于所述预设数据控制所述振动部件产生振动和传感器（13,23,33,43），其感测所述振动部件的振动，并且生成表示所述振动部件的振动的信号，以用于训练或测试所述状态监测模块。由此，能够简单、高效、可靠并且低成本地提供大量监测数据，以用于对状态监测模块进行训练或测试。

The present invention may provide a particle detector or imager which may be used for accurate recording of medical (2-D) X-ray images. The imager includes at least one detector panel. The detector panel includes a microgap detector with an array of pixel electrodes of a novel form. Each pixel electrode is insulated from a planar cathode by means of an insulating layer. Each pixel electrode is connected to an underlying contact by means of a via hole in the insulating layer. The insulating layer is preferable conformal with the electrodes. The underlying contact is connected to an electronic measuring element which preferably lies underneath the electrode and is about the same size as the electrode. The measuring element may be a storage device, a digital counter or similar. A switching transistor is connected to the measuring device. The switching transistor may be a thin film transistor. Alternatively, both measuring element and transistor may be formed in a single crystal semiconductor, e.g. a VLSI, and a complete imager formed from several detector panels in an array. The drift electrode of the microgap detector preferably includes a photocathode. The photocathode may be directly evaporated onto a phosphor.

940,730. Piezo-resistive accelerometers. WESTERN ELECTRIC CO. Inc. Feb. 17,1960 [Feb. 18, 1959], No. 5639/60. Heading G1N. In an accelerometer a single unitary indicating element comprises a central mass with one or more pairs of collinear legs cut from a single crystal of a piezo-resistive substance, which legs are so orientated with respect to the crystallographic axes that the electrical resistances between the respective legs of a pair and an ohmic contact on the central mass vary oppositely when one leg is put under compression and the other under tension. Construction of transducer; Fig. 6 shows an element cut from a single silicon crystal and comprising a spherical central mass 60 and three mutually perpendicular pairs of collinear projecting legs 61, 62; 63, 64; and 65, 66, which are as thin as is compatible with strength and which are attached at their outer ends by enlarged feet to a rigid framework 70, 72. Modifications with two pairs and one pair of legs are described; and the legs may be secured directly to a vehicle instead of to a frame. Details are given as to the proper orientation of the legs in relation to the crystallographic axes in accordance with the material of the semi-conductor. The mass of the central sphere may be increased by loading it with lead, resin &c. Circuit arrangements; Fig.7. The resistances between the respective legs of a pair form adjacent arms, e.g. 161,162 of an A. C. bridge circuit, with an indicator such as 40 showing the component of acceleration in the direction concerned. To compensate for the fact that in practice an acceleration in the direction of one pair of legs may cause resistance variations in the circuits associated with the others, each bridge output diagonal has an adjustable coupling with the output diagonals of each of the other bridges. To remove ambiguity as to the sense of the acceleration, when using a simple circuit with an element having only one pair of legs, an additional meter 208, Fig. 9, sensitive to phase sense may be associated with each input diagonal. Alternatively D.C. bridges may be used. Modifications. Combinations of the single pair of legs elements, suitably orientated, or the double pair of legs form may also be used to obtain response to coplanar multidirectional accelerations. Specifications 881, 832 and 881, 834 are referred to.

A double-sided optical inspection system is presented which may detect and classify particles, pits and scratches on thin film disks or wafers in a single scan of the surface. In one embodiment, the invention uses a pair of orthogonally oriented laser beams, one in the radial and one in the circumferential direction on both surfaces of the wafer or thin film disk. The scattered light from radial and circumferential beams is separated via their polarization or by the use of a dichroic mirror together with two different laser wavelengths.

759,047. Semi-conductor devices. SIEMENSSCHUCKERTWERKE AKT.-GES. Nov. 12, 1953 [Nov. 12, 1952], No. 31411/53. Class 37. An instrument for measuring a magnetic field comprises a member, consisting of a semi-conducting compound of Am Bv type and having a carrier mobility of at least 6000 cms.2/volt. sec. AIII Bv type refers to a compound of one of the elements B, A1, Ga, or In with one of the elements N, P, As or Sb. The field may be measured by means of a bridge circuit adapted to measure the change in resistance of the member when subjected to the magnetic field. Alternatively the Hall effect of the member may be utilized as shown in Fig. 2, in which measurement is effected by balancing the Hall potential developed in member M against a standard potential obtained from potentiometer K. Fig. 3 shows a bridge circuit arrangement in which the combination of the resistance change and the Hall potential both developed by member M, when it is subjected to the magnetic field, are utilized to measure the magnetic field. Specification 719,873 is referred to.

1,013,141. Automatic amplitude control. MINISTER OF AVIATION. Dec. 28, 1961 [Dec. 30, 1960], No. 44872/60. Heading G3R. [Also in Divisions H3 and H4] A stabilized microwave oscillation generator comprises a basic microwave oscillator having means for controlling its frequency of oscillation in response to a first controlling signal, a microwave output amplifier having means for controlling its output amplitude in response to a second controlling signal, the basic microwave oscillator feeding its output to the microwave amplifier, and means for producing error signals indicating frequency error and amplitude error in the output oscillation of the stabilized oscillation generator and for applying them to the basic microwave oscillator and the microwave amplifier respectively to control the output frequency and amplitude. A two cavity klystron oscillator 1 of a c.w. radar transmitter is coupled through a ferrite isolator 2 to a two-stage klystron amplifier 3A 3B feeding an output waveguide 7; and antenna 8 a fraction of the output being tapped off by a directional coupler 18, passed through a ferrite modulator 4 and phase shifter 20, and injected into the guide through directional coupler 19. A bridge type frequency discriminator 9 of the kind described in Specification 836,165 is coupled to the waveguide by directional coupler 10 and produces signals at 11 representing amplitude variation error of the waveguide output, and signal at 12 representing frequency variation error to feed Doppler frequency amplifiers 14, 16 of e.g. 1-60 kc./s. bandwidth respectively energizing a modulator 6 in the EHT supply 5 to the oscillator klystron and the ferrite modulator to stabilize the oscillator amplifier against frequency and amplitude variations at Doppler frequencies, while a D.C. amplifier 17 energized from undirectional components of signal 12 controls the stabilized EHT supply to remove mean frequency variations. The amplitude control signals may alternatively be obtained from the IF envelope detector of a superheterodyne receiver fed from the waveguide output, and the Doppler and D.C. amplifier 14, 17 may be combined. The ferrite modulator may be replaced by a semi-conductor modulator, and the discriminator bridge may be of the improved type set forth in Specification 997,282.