基本信息
摘要：PURPOSE:To allow inspection of defective pixel for a poly-crystalline silicon thin film transistor(TFT) array substrate prior to liquid crystal injection process by providing an image processor for detecting the defective pixel. CONSTITUTION:Detection signals being arranged in time series by means of an analog multiplexer 5 are sampled and held in the vicinity of maximum level thereof by a sample & hold circuit 6 according to clock signals generated from a timing generator 1. The holding time is set equal to the clock period of the clock signal. An analog waveform having microdifference of height at the output end of the circuit 6 is sliced by a slicing circuit 7 according to a cutback timing pattern before being fed to a variable gain amplifier circuit 8. The amplified signal is subjected to A/D conversion 9 and fed to an image processor 10 where the average value of charge data is calculated for the pixels of a single data line followed by calculation of the difference from the data.
摘要附图：
