基本信息

• 发明名称： 【发明专利】 Improvements in or relating to the measurement of a gradient and/or a higher derivative of magnetic fields
• 申请日： 1970-08-16
• 申请号/专利号： GB4363864
• 专利权人： 无
• 申请人： SIEMENS AG
• 分类号： G01R33/09
• 发明人/设计人： 无
• 公开日/公告日： 1970.08.16
• 优先权号： G01R33/09
• 代理机构：
• 代理人：
• PCT申请号： 无
• PCT申请日期： 无
• PCT进入国家阶段日： 无
• 生物宝藏信息： 无
• 审查员： 无

摘要：1,020,974. Magnetic tests. SIEMENSSCHUCKERTWERKE A.G. Oct. 26, 1964 [Oct. 26, 1963], No. 43638/64. Heading G1N. [Also in Division H1] An indication of the gradient of a magnetic field is given by a meter 9 connected across a bridge circuit containing two probe arms 1, 2 joined by a bridge 18, the probe arms and the bridge being formed integrally from a single piece of magneto-resistive semi-conductor material, such as indium antimonide. The bridge 18 is metallized, and mutually parallel strips of good conductivity may be mounted on or embedded in the probe arms 1, 2 at right angles to their axes. Two such devices, possibly formed from a single piece of semi-conductor material, Fig. 4 (not shown), may be combined to measure the second derivative with respect to distance of the magnetic field.

摘要附图：