基本信息

• 发明名称： 【发明专利】 Improvements in or relating to semiconductor strain gauges
• 申请日： 1970-08-16
• 申请号/专利号： GB1230364
• 专利权人： 无
• 申请人： WESTERN ELECTRIC CO
• 分类号：
• 发明人/设计人： 无
• 公开日/公告日： 1970.08.16
• 优先权号：
• 代理机构：
• 代理人：
• PCT申请号： 无
• PCT申请日期： 无
• PCT进入国家阶段日： 无
• 生物宝藏信息： 无
• 审查员： 无

摘要：1,059,074. Semi-conductor devices. WESTERN ELECTRIC CO. Inc. March 24, 1964 [March 29, 1963], No. 12303/64. Heading HIK. A piezo-resistive strain gauge comprising a wafer of semi-conductor material having a cubic crystal structure is made insensitive to transverse and shear strains by choosing the orientation of the plane of the wafer in relation to the crystal lattice according to one of three given formulµ which express this orientation in terms of the piezo-resistive and compliance coefficients of the material. One of the formulµ relates to current measurement in the plane of the wafer and the other two relate to current measurement perpendicular to this plane. Specific examples are given for N and P type germanium, silicon, and lead telluride.

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