基本信息

• 发明名称： 【发明专利】 Improvements in or relating to methods for measuring magnetic fields
• 申请日： 1970-08-15
• 申请号/专利号： GB1417956
• 专利权人： 无
• 申请人： SIEMENS AG
• 分类号：
• 发明人/设计人： 无
• 公开日/公告日： 1970.08.16
• 优先权号：
• 代理机构：
• 代理人：
• PCT申请号： 无
• PCT申请日期： 无
• PCT进入国家阶段日： 无
• 生物宝藏信息： 无
• 审查员： 无

摘要：817,553. Magnetic tests. SIEMENSSCHUCKERTWERKE A.G. May 7, 1956 [May 6, 1955], No. 14179/56. Addition to 759,047. Class 37. The magnetic properties of a magnetic material are determined by placing a semiconductor adjacent the surface of the material under test, the semi-conductor being of the AIII BV type having a carrier mobility of 6000 cm.2/volt. sec. or more claimed in the parent Specification. The semi-conductor may be used as a Hall plate, or its change of resistance with magnetic field strength may be measured. Fig. 3 shows an arrangement in which the material 23 under test is situated between the poles 21a of an electromagnet. Hall plate 25 is placed against one of the faces of the material in an air gap between it and one of the polepieces and produces an output indicative of the induction in the test material. An additional Hall plate 27 placed edge-on may measure the field near the surface of the specimen, i.e. H By connecting the outputs of the two Hall plates in opposition the magnetization intensity, B-H, may be measured. Fig. 4 shows an arrangement for examining a magnetic plate 32 for anisotropism. The field is produced by current in a central conductor 33 and the semi-conductor is placed in various radial positions to determine maximum and minimum field strength and thus the preferred magnetic direction of the material. Specifications 719,873 and 797,505 also are referred to.

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