Continuous on-line thin film measurements employ a sensor having a spectrometer for interferometric measurements and a stack of single channel detectors for adsorption measurements. The stack is separated from the spectrometer, which analyzes radiation that emerges (transmitted pass or reflected from) the film, whereas the stack analyzes radiation that has passed through the film multiple times. The spectrometer is (i) positioned directly opposite the source of radiation so that it detects transmitted radiation or (ii) disposed on the same side of the film as is the source of radiation so that the spectrometer detects radiation that is specularly reflected from the film. The sensor includes a broadband radiation source emitting visible to far infrared light which propagates through a measurement cell defined by reflective surfaces exhibiting Lambertian-type scattering. The sensor is capable of measuring thin plastic films with thicknesses down to 1 micron or less. La présente invention concerne des mesures de film mince en ligne et en continu utilisant un capteur ayant un spectromètre pour des mesures interférométriques et un empilement de détecteurs à canal unique pour des mesures d'adsorption. L'empilement est séparé du spectromètre, lequel analyse un rayonnement qui émerge du film (transmis devant ou réfléchi depuis celui-ci), tandis que l'empilement analyse le rayonnement qui est passé à travers le film de multiples fois. Le spectromètre est (i) positionné directement à l'opposé de la source de rayonnement, de sorte qu'il détecte un rayonnement transmis ou (ii) disposé du même côté du film comme l'est la source de rayonnement, de sorte que le spectromètre détecte le rayonnement qui est réfléchi de manière spéculaire depuis le film. Le capteur comprend une source de rayonnement à large bande émettant une lumière visible à infrarouge lointain qui se propage à travers une cellule de mesure définie par des surfaces réfléchissantes présentant une diffusion de type Lambertien. Le capteur est capable de mesurer des films minces en plastique présentant des épaisseurs jusqu'à 1 micromètre ou moins.

Continuous on-line thin film measurements employ a sensor having a spectrometer for interferometric measurements and a stack of single channel detectors for adsorption measurements. The stack is separated from the spectrometer, which analyzes radiation that emerges (transmitted pass or reflected from) the film, whereas the stack analyzes radiation that has passed through the film multiple times. The spectrometer is (i) positioned directly opposite the source of radiation so that it detects transmitted radiation or (ii) disposed on the same side of the film as is the source of radiation so that the spectrometer detects radiation that is specularly reflected from the film. The sensor includes a broadband radiation source emitting visible to far infrared light which propagates through a measurement cell defined by reflective surfaces exhibiting Lambertian-type scattering. The sensor is capable of measuring thin plastic films with thicknesses down to 1 micron or less.

592,161. Coil -- less resonators. SPERRY GYROSCOPE CO., Inc. July 23, 1943, No. 24309/45. Convention date, Feb. 4, 1942. Divided out of 592,119. [Class 40 (iii)] [Also in Group XXXVI] Apparatus having broad frequency band characteristics is arranged so as to, effect energy division in a concentric line. As shown in Fig. 1, two hollow end conductors 25, 26 are held a fixed distance apart by a member 27 and terminated by tapered concentric line adaptors 28, 28<1> adapted to receive concentric transmission line terminals. A central member 29 is slidably mounted between the two end members 25, 26 and can be fixed in adjusted position by a screw 30 slidable in a slot in the member 27. The inner conductor of the central member 29 has a varying diameter, whilst the outer conductor is of constant diameter. The central member 29 is provided with a high impedance tap 34 at its lowest impedance point, where the inner conductor has a sudden reduction in diameter, corresponding to an increase in impedance. The tap 34 has attached to it an outer conductor 54 of constant inner diameter and an inner conductor 53 of slowly increasing diameter, so that at the point 55 the impedance of the line is equal to that of the line to be attached. In order to allow for the effect of standing waves due to energy reflections, the position of the tap between the two fixed end sections 25, 26 is varied so as to obtain maximum and minimum readings from which the actual energy transfer along the transmission line may be determined. In order to minimize end reflections due to wall thickness at a sliding joint in a concentric line, the tube end may be cut at an angle as shown at 32, Fig. 2, or may be terminated in a helix 32<1>, Fig. 3. Alternatively, the ends of the sliding tubes exposed to the travelling waves may be staggered by a distance equal to a quarter wavelength as described in Specification 581,972. In the alternative form of current or energy dividing device shown in Fig. 4, energy to be divided is introduced into the tapered matching end 59 and is divided into calculable portions at the tap 341. The portion tapped by the branch 49<1> is fed to a device for measurement or other purposes whilst the remainder travels into a terminating impedance 36, which may be of carbon, graphite, or other semi-conductor. The unused energy is entirely absorbed and no reflection can occur to cause a standing wave at the tap 34<1>, which may therefore be fixed. In a modification, Fig. 5, the inner conductor is stepped at 62, 63, 64, 65, 67, 68, 69 and the inner conductor of the branch is stepped at 66, 67, 72, 73. The steps are such that the change in the logarithm of the impedance at each step is proportional to the corresponding binomial coefficient of order one less than the number of steps. Two or more of the current dividing devices shown in Figs. 1, 4 or 5 may be used in cascade. The outer conductor may vary in diameter.

PROBLEM TO BE SOLVED: To provide an optical sensor which high sensitivity which detects a chemical substance dissolved or dispersed in water. SOLUTION: The optical sensor 1 for detecting a chemical substance in water is provided with a detection element 2 having a polymer thin film 22, a light source part 3 for radiating light for irradiating the polymer thin film 22, and a light detector 4 for detecting intensity of lights reflected from the polymer thin film 22. The detection element 2, light source part 3 and light detector 4 are fitted integrally with a housing 7. The polymer thin film 22 is formed on a high reflection substrate 21, and mutually acts on a chemical substance dissolved or scattered in water in a water passage 8.

A filter capable of removing mercury in high purity gas or aerosol comprises a cylindrical outer chamber (2) having an inlet pipe (3) and an outlet pipe (5) respectively at the two ends thereof, and multiple groups of stepped liners (1) and tapered outer casings (4) that are cooperatively mounted within the outer chamber (2). One stepped liner (1) is mounted between two adjacent tapered outer casings (4). Both step faces of the stepped liners (1) and step holes of the tapered outer casings (4) have gold coatings of 2-10 μm. A void channel (6) is formed between the step faces of the stepped liners (1) and the step holes of the tapered outer casings (4), and the inlet pipe (3) and the outlet pipe (5) are connected by the void channel (6). Gold amalgam is formed by means of absorption of mercury by the gold coating to realize the filtration of mercury, making possible analysis of ultralow quantities of lead isotope in a mineral, which is otherwise impossible in the current field of microanalysis. The invention is of great significance in the research of zircon dating and analysis of the composition of monomineralic lead isotope using the current laser ablation quadrupole plasma mass spectrometry and multi-collector plasma mass spectrometry techniques. La présente invention concerne un filtre capable d'éliminer le mercure contenu dans un gaz de pureté élevée ou un aérosol qui comprend une chambre extérieure cylindrique (2) présentant un tuyau d'entrée (3) et un tuyau de sortie (5) respectivement aux deux extrémités de celle-ci, et de multiples groupes de revêtements étagés (1) et des boîtiers extérieurs coniques (4) qui sont montés en coopération à l'intérieur de la chambre extérieure (2). Un revêtement étagé (1) est monté entre deux boîtiers extérieurs coniques (4) adjacents. Les deux faces des étages des revêtements étagés (1) et des trous pour étages des boîtiers extérieurs coniques (4) ont des revêtements d'or de 2 à 10 µm. Un canal vide (6) est formé entre les faces des étages des revêtements étagés (1) et des trous pour étages des boîtiers extérieurs coniques (4), et le tuyau d'entrée (3) et le tuyau de sortie (5) sont reliés par le canal vide. (6) Un amalgame d'or est formé par absorption du mercure par le revêtement d'or pour réaliser la filtration de mercure, rendant possible l'analyse de quantités très faibles d'isotope du plomb dans un minéral, ce qui est autrement impossible dans le domaine actuel de la microanalyse. L'invention est d'une grande importance dans la recherche de datation sur zircons et l'analyse de la composition de l'isotope du plomb monominéral en utilisant les techniques actuelles de spectrométrie de masse quadripolaire à plasma couplée à l'ablation laser et de spectrométrie de masse à plasma à collecteur multiple. 一种能去除高纯气体或气溶胶中的汞的过滤器，包括柱形的外室(2)，外室(2)的两端分别有进气管(3)和出气管(5)，外室(2)内部安装有多组相互配合安装的阶梯型内胆(1)和渐变形外套(4)，相邻两个渐变形外套(4)中间安装一个阶梯型内胆(1)，阶梯型内胆(1)的阶梯面上和渐变形外套(4)的阶梯孔上均有2～10μm的镀金层，阶梯型内胆(1)的阶梯面和渐变形外套(4)的阶梯孔之间形成空隙通道(6)，该空隙通道(6)连通进气管(3)和出气管(5)。通过镀金层吸附汞形成金汞齐，达到过滤汞的目的，使得目前微区分析中无法实现的矿物中超低含量铅同位素分析成为可能，对当前的激光剥蚀四级杆等离子体质谱和多接收等离子体质谱技术在锆石定年和单矿物铅同位素组成分析的研究具有重要意义。

Continuous on-line thin film measurements employ a sensor having a spectrometer for interferometric measurements and a stack of single channel detectors for adsorption measurements. The stack is separated from the spectrometer, which analyzes radiation that emerges (transmitted pass or reflected from) the film, whereas the stack analyzes radiation that has passed through the film multiple times. The spectrometer is (i) positioned directly opposite the source of radiation so that it detects transmitted radiation or (ii) disposed on the same side of the film as is the source of radiation so that the spectrometer detects radiation that is specularly reflected from the film. The sensor includes a broadband radiation source emitting visible to far infrared light which propagates through a measurement cell defined by reflective surfaces exhibiting Lambertian-type scattering. The sensor is capable of measuring thin plastic films with thicknesses down to 1 micron or less.

The present invention relates to a system and process for detection and/or qualitative and quantitative identification of the biological material, such as specific sequences of nucleic acids or proteins as antibodies, present in biological samples. The system is composed by one or more light sources (1) combined with one or more integrated optical photo sensors, or not, and various electronic components (4), necessary for obtaining/processing of the signal emitted by the metal nanoprobes functionalized with a solution of biological composite, as well as also a micro-controller and a microprocessor, fixed or portable. This photosensor structure is able to detect and to quantify the color variations produced by metal nanoprobes, being this preferentially gold, functionalized by oligonucleotides complementary to specific DNA/RNA sequences, proteins, as for instance antibodies and/or antigens related with certain disease, or other sample or solution of biological composite, that are to be investigated. The detection and quantification process is based on the response of a photosensor, singular or integrated, based on thin film technology of amorphous, nanocrystalline or microcrystalline silicon and their alloys, as well as the new active ceramic semiconductors, amorphous and not amorphous.

Technologies are generally described for methods and systems for sensing or imaging. The apparatus includes a stack of a plurality of thin films, such as polymer thin films. The stack has a substantially imaginary total reflectance coefficient.